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MTV
2005
IEEE
15 years 3 months ago
2005
IEEE
Microprocessor technology is increasingly used for many applications; the large market volumes call for cost containment in the production phase. Process yield for processor produ...
EH
2005
IEEE
15 years 3 months ago
2005
IEEE
Manufacturing processes are a key source of faults in complex hardware systems. Minimizing this impact of manufacturing uncertainties is one way towards achieving fault tolerant s...
VTS
1996
IEEE
15 years 1 months ago
1996
IEEE
This paper presents an innovative method for inserting test points in the circuit-under-test to obtain complete fault coverage for a specified set of test patterns. Rather than us...
ETS
2011
IEEE
13 years 9 months ago
2011
IEEE
Abstract—Networks-on-Chip (NoCs) are implicitly fault tolerant due to their inherent redundancy. They can overcome defective cores, links and switches. As a side effect, yield is...
SAC
2008
ACM
14 years 9 months ago
2008
ACM
Despite extensive testing in the development phase, residual defects can be a great threat to dependability in the operational phase. This paper studies the utility of lowcost, ge...