107 search results - page 12 / 22 » Active Fault Diagnosis Based on Stochastic Tests |
VTS
2008
IEEE
15 years 4 months ago
2008
IEEE
— Higher chip densities and the push for higher performance have continued to drive design needs. Transition delay fault testing has become the preferred method for ensuring thes...
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IFIP12
2004
14 years 11 months ago
2004
Recent years have seen considerable developments in modeling techniques for automatic fault location in programs. However, much of this research considered the models from a standa...
DAC
2004
ACM
15 years 3 months ago
2004
ACM
In order to improve the testabilities and power consumption, a new state assignment technique based on m-block partition is introduced in this paper. The length and number of feed...
GLVLSI
2007
IEEE
15 years 4 months ago
2007
IEEE
The path-delay fault simulation of functional tests on complex circuits such as current processor-based systems is a daunting task. The amount of computing power and memory needed...
DSD
2006
IEEE
15 years 3 months ago
2006
IEEE
Recently, a number of works have been published on implementing assignment decision diagram models combined with SAT methods to address register-transfer level test pattern genera...