107 search results - page 13 / 22 » Active Fault Diagnosis Based on Stochastic Tests |
ICSM
2006
IEEE
15 years 3 months ago
2006
IEEE
The test case execution order affects the time at which the objectives of testing are met. If the objective is fault detection, an inappropriate execution order might reveal most ...
GI
2007
Springer
15 years 3 months ago
2007
Springer
: A strategy for automatic test case selection based on the use of a similarity function is presented. Test case selection is a crucial activity to model-based testing since the nu...
ET
2000
14 years 9 months ago
2000
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
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SIGSOFT
2006
ACM
15 years 10 months ago
2006
ACM
Recent software systems usually feature an automated failure reporting system, with which a huge number of failing traces are collected every day. In order to prioritize fault dia...
ICCAD
2002
IEEE
15 years 6 months ago
2002
IEEE
This work presents several new techniques for enhancing the performance of deterministic test pattern generation for VLSI circuits. The techniques introduced are called dynamic de...