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» Active Fault Diagnosis Based on Stochastic Tests
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ISESE
2006
IEEE
15 years 3 months ago
An industrial case study of structural testing applied to safety-critical embedded software
Effective testing of safety-critical real-time embedded software is difficult and expensive. Many companies are hesitant about the cost of formalized criteria-based testing and a...
Jing Guan, Jeff Offutt, Paul Ammann
IPPS
2002
IEEE
15 years 2 months ago
A Framework for Network Management Using Mobile Agents
Conventional network management is based on SNMP and often run in a centralized manner. Although the centralized management approach gives network administrators a flexibility of ...
Manoj Kumar Kona, Cheng-Zhong Xu
HPCA
2006
IEEE
15 years 10 months ago
BulletProof: a defect-tolerant CMP switch architecture
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
Kypros Constantinides, Stephen Plaza, Jason A. Blo...
SLIP
2005
ACM
15 years 3 months ago
Multilevel full-chip routing with testability and yield enhancement
We propose in this paper a multilevel full-chip routing algorithm that improves testability and diagnosability, manufacturability, and signal integrity for yield enhancement. Two ...
Katherine Shu-Min Li, Chung-Len Lee, Yao-Wen Chang...
CASES
2007
ACM
15 years 1 months ago
SCCP/x: a compilation profile to support testing and verification of optimized code
Embedded systems are often used in safety-critical environments. Thus, thorough testing of them is mandatory. A quite active research area is the automatic test-case generation fo...
Raimund Kirner