107 search results - page 19 / 22 » Active Fault Diagnosis Based on Stochastic Tests |
CJ
2004
14 years 9 months ago
2004
This paper describes a way to manage the modeling and analysis of Scheduled Maintenance Systems (SMS) within an analytically tractable context. We chose a significant case study h...
DATE
2008
IEEE
15 years 4 months ago
2008
IEEE
Circuit fabrics composed of highly regular structures, called logic bricks, have been described recently for improving yield. An automated logic brick design flow based on a SAT ...
MICRO
2007
IEEE
15 years 4 months ago
2007
IEEE
As silicon process technology scales deeper into the nanometer regime, hardware defects are becoming more common. Such defects are bound to hinder the correct operation of future ...
ASPLOS
2006
ACM
15 years 3 months ago
2006
ACM
Concurrency bugs are among the most difficult to test and diagnose of all software bugs. The multicore technology trend worsens this problem. Most previous concurrency bug detect...
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SETN
2004
Springer
15 years 3 months ago
2004
Springer
We present novel intelligent tools for mining 3D medical images. We focus on detecting discriminative Regions of Interest (ROIs) and mining associations between their spatial distr...