107 search results - page 4 / 22 » Active Fault Diagnosis Based on Stochastic Tests |
JCP
2006
14 years 9 months ago
2006
Abstract-- In this paper a novel pulse sequence testing methodology is presented [22] as an alternative to Time Domain Reflectometry (TDR) for transmission line health condition mo...
VLSID
2001
IEEE
15 years 10 months ago
2001
IEEE
A technique for signature based diagnosis using windows of different sizes is presented. It allows to obtain increased diagnostic information from a given test at a lower cost, wi...
DAC
2000
ACM
15 years 10 months ago
2000
ACM
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
ASPDAC
2001
ACM
15 years 1 months ago
2001
ACM
Loical defect diagnosis is a critical yet challenging process in VLSI manufacturing. It involves the identification of the defect spots in a logic IC that fails testing. In the la...
EWCBR
2004
Springer
15 years 3 months ago
2004
Springer
In industrial manufacturing rigorous testing is used to ensure that the delivered products meet their specifications. Mechanical maladjustment or faults often show their presence t...