Meeting power and performance requirement is a challenging task in high speed ALUs. Supply voltage scaling is promising because it reduces both switching and active power but it al...
NBTI (Negative Bias Temperature Instability) has emerged as the dominant PMOS device failure mechanism for sub100nm VLSI designs. There is little research to quantify its impact o...
— Clock-gating and power-gating have proven to be very effective solutions for reducing dynamic and static power, respectively. The two techniques may be coupled in such a way th...
Leticia Maria Veiras Bolzani, Andrea Calimera, Alb...
In this paper we describe an area efficient power minimization scheme "Control Generated ClockingI` that saves significant amounts of power in datapath registers and clock dr...
Dynamic gates have been excellent choice in the design of high-performance modules in modern microprocessors. The only limitation of dynamic gates is their relatively low noise mar...