In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
Abstract- The large majority of existing clustering algorithms are centered around the notion of a feature, that is, individual data items are represented by their intrinsic proper...
We treat feature selection and basis selection in a unified framework by introducing the masking matrix. If one considers feature selection as finding a binary mask vector that de...
The two major problems raised by a region-based image retrieval system are the automatic definition and description of regions. In this paper we first present a technique of unsup...
A major challenge of the anti-virus (AV) industry is how to effectively process the huge influx of malware samples they receive every day. One possible solution to this problem i...