26 search results - page 2 / 6 » Adaptive Diagnostic Pattern Generation for Scan Chains |
VTS
1997
IEEE
15 years 3 months ago
1997
IEEE
A new approach for testing the bistable elements (latches and flip-flops) in scan chain circuits is presented. In this approach, we generate test patterns that apply a checking ex...
ATS
2009
IEEE
15 years 6 months ago
2009
IEEE
Diagnosis is increasingly important, not only for individual analysis of failing ICs, but also for high-volume test response analysis which enables yield and test improvement. Sca...
ET
2000
14 years 11 months ago
2000
An efficient deterministic BIST scheme based on partial scan chains together with a scan selection algorithm tailored for BIST is presented. The algorithm determines a minimum num...
81
Voted
DAC
1997
ACM
15 years 3 months ago
1997
ACM
This paper presents a new scan-based BIST scheme which achieves very high fault coverage without the deficiencies of previously proposed schemes. This approach utilizes scan order...
VLSID
2005
IEEE
16 years 2 days ago
2005
IEEE
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...