137 search results - page 6 / 28 » Adaptive Techniques for Improving Delay Fault Diagnosis |
ITC
2003
IEEE
15 years 2 months ago
2003
IEEE
Diagnosing failing vectors in a Built-In Self Test (BIST) environment is a difficult task because of the highly compressed signature coming out of the Multiple Input Shift Regist...
ITC
2003
IEEE
15 years 2 months ago
2003
IEEE
Faster defect localization is achieved by combining IC simulations and internal measurements. Time resolved photon emission records photons emitted during commutations (current) r...
SMC
2007
IEEE
15 years 3 months ago
2007
IEEE
—This paper considers the problem of temporally fusing classifier outputs to improve the overall diagnostic classification accuracy in safety-critical systems. Here, we discuss d...
TFS
2008
14 years 9 months ago
2008
A reliable monitoring system is critically needed in a wide range of industries to detect the occurrence of a fault to prevent machinery performance degradation, malfunction, and s...
FTCS
1997
14 years 10 months ago
1997
In this paper the consolidate identification of faults, distinguished as transient or permanent/intermittent, is approached. Transient faults discrimination has long been performe...