137 search results - page 7 / 28 » Adaptive Techniques for Improving Delay Fault Diagnosis |
ICCAD
2010
IEEE
14 years 7 months ago
2010
IEEE
Extreme technology scaling in silicon devices drastically affects reliability, particularly because of runtime failures induced by transistor wearout. Currently available online t...
ITC
2003
IEEE
15 years 2 months ago
2003
IEEE
: The paper presents a novel technique for generating effective vectors for delay defects. The test set achieves high path delay fault coverage to capture smalldistributed delay de...
DAC
2006
ACM
15 years 10 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
DSN
2008
IEEE
15 years 4 months ago
2008
IEEE
In the near future, hardware is expected to become increasingly vulnerable to faults due to continuously decreasing feature size. Software-level symptoms have previously been used...
NETWORKING
2004
14 years 11 months ago
2004
Probabilistic inference was shown effective in non-deterministic diagnosis of end-to-end service failures. Since exact probabilistic diagnosis is known to be an NP-hard problem, a...