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STTT
2008
117views more  STTT 2008»
14 years 11 months ago
An approach to quality engineering of TTCN-3 test specifications
Abstract Experience with the development and maintenance of large test suites specified using the Testing and Test Control Notation (TTCN-3) has shown that it is difficult to const...
Helmut Neukirchen, Benjamin Zeiss, Jens Grabowski
ET
2010
113views more  ET 2010»
14 years 9 months ago
Calibration and Test Time Reduction Techniques for Digitally-Calibrated Designs: an ADC Case Study
Modern mixed-signal/RF circuits with a digital calibration capability could achieve significant performance improvement through calibration. However, the calibration process often ...
Hsiu-Ming Chang, Kuan-Yu Lin, Kwang-Ting (Tim) Che...
CORR
2010
Springer
104views Education» more  CORR 2010»
14 years 11 months ago
Heuristic approach to optimize the number of test cases for simple circuits
In this paper a new solution is proposed for testing simple stwo stage electronic circuits. It minimizes the number of tests to be performed to determine the genuinity of the circ...
S. M. Thamarai, K. Kuppusamy, T. Meyyappan
ISSTA
2006
ACM
15 years 5 months ago
Tool support for randomized unit testing
There are several problem areas that must be addressed when applying randomization to unit testing. As yet no general, fully automated solution that works for all units has been p...
James H. Andrews, Susmita Haldar, Yong Lei, Felix ...
COCO
2004
Springer
93views Algorithms» more  COCO 2004»
15 years 5 months ago
Lower Bounds for Testing Bipartiteness in Dense Graphs
We consider the problem of testing bipartiteness in the adjacency matrix model. The best known algorithm, due to Alon and Krivelevich, distinguishes between bipartite graphs and g...
Andrej Bogdanov, Luca Trevisan