21183 search results - page 176 / 4237 » Adaptive Testing by Test |
160
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ICCD
2003
IEEE
15 years 11 months ago
2003
IEEE
We present a test scheduling methodology for core-based system-on-chips that allows tradeoff between system power dissipation and overall test time. The basic strategy is to use t...
125
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DATE
2010
IEEE
15 years 11 months ago
2010
IEEE
—Many systems are based on embedded microcontrollers. Applications demand for production and Power-On testing, including memory testing. Because low-end microcontrollers may not ...
152
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DATE
2000
IEEE
15 years 10 months ago
2000
IEEE
We describe a method for on-chip generation of weighted test sequences for synchronous sequential circuits. For combinational circuits, three weights, 0, 0.5 and 1, are sufficien...
148
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ICCAD
2000
IEEE
15 years 10 months ago
2000
IEEE
This paper presents new test generation techniques for improving the average-case performance of the iterative logic array based deterministic sequential circuit test generation a...
138
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ITC
2000
IEEE
15 years 10 months ago
2000
IEEE
Boards have evolved into complex systems and even collections of interacting systems. Test engineers struggle to find out how these systems are initialized and booted because of p...