21183 search results - page 191 / 4237 » Adaptive Testing by Test |
186
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ICASSP
2011
IEEE
14 years 10 months ago
2011
IEEE
Recently, Multiple Background Models (M-BMs) [1, 2] have been shown to be useful in speaker verification, where the M-BMs are formed based on different Vocal Tract Lengths (VTLs)...
154
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VLSID
2003
IEEE
16 years 6 months ago
2003
IEEE
This paper introduces a Built-In Self Test (BIST) structure referred to as Universal BIST (UBIST). The Test Pattern Generator (TPG) of the proposed UBIST is designed to generate an...
168
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CBSE
2004
Springer
15 years 11 months ago
2004
Springer
Abstract. This paper proposes a conceptual framework for the reliability assessment of software components that incorporates test case execution and output evaluation. Determining ...
164
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VTS
2003
IEEE
15 years 11 months ago
2003
IEEE
In this paper, an efficient technique for test data volume reduction based on the shared scan-in (Illinois Scan) architecture and the scan chain reconfiguration (Dynamic Scan) arc...
154
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VTS
2000
IEEE
15 years 10 months ago
2000
IEEE
Delay defects can escape detection during the normal production test flow, particularly if they do not affect any of the long paths included in the test flow. Some defect types ca...