21183 search results - page 249 / 4237 » Adaptive Testing by Test |
162
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DATE
2006
IEEE
16 years 1 months ago
2006
IEEE
— We present a probabilistic fault model that allows any number of gates in an integrated circuit to fail probabilistically. Tests for this fault model, determined using the theo...
166
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DATE
2006
IEEE
16 years 1 months ago
2006
IEEE
This paper presents a wrapper and test access mechanism design for multi-clock domain SoCs that consists of cores with different clock frequencies during test. We also propose a t...
186
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ETS
2006
IEEE
16 years 1 months ago
2006
IEEE
In this paper we address the test scheduling problem for Builtin Self-tested (BISTed) embedded SRAMs (e-SRAMs) when Data Retention Faults (DRFs) are considered. The proposed test ...
192
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ISSRE
2006
IEEE
16 years 1 months ago
2006
IEEE
The widespread deployment of graphical-user interfaces (GUIs) has increased the overall complexity of testing. A GUI test designer needs to perform the daunting task of adequately...
146
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ISSTA
2006
ACM
16 years 1 months ago
2006
ACM
This paper extends basic software-testing theory to software components and adds explicit state to the theory. The resulting theory e enough to abstractly model the construction o...