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ASPDAC
2006
ACM
119views Hardware» more  ASPDAC 2006»
15 years 10 months ago
A dynamic test compaction procedure for high-quality path delay testing
- We propose a dynamic test compaction procedure to generate high-quality test patterns for path delay faults. While the proposed procedure generates a compact two-pattern test set...
Masayasu Fukunaga, Seiji Kajihara, Xiaoqing Wen, T...
ATS
2002
IEEE
110views Hardware» more  ATS 2002»
15 years 9 months ago
Test Requirement Analysis for Low Cost Hierarchical Test Path Construction
We propose a methodology that examines design modules and identifies appropriate vector justification and response propagation requirements for hierarchical test. Based on a cel...
Yiorgos Makris, Alex Orailoglu
137
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GI
2009
Springer
15 years 2 months ago
A Generic Approach for Modeling Test Case Priorities with Applications for Test Development and Execution
: This contribution addresses systematic test development methods to include an algorithm to retrieve a test suite execution control in order to run test cases with high priority e...
Andreas Hoffmann, Axel Rennoch, Ina Schieferdecker...
ISSTA
2006
ACM
15 years 10 months ago
Integrating customized test requirements with traditional requirements in web application testing
Existing test suite reduction techniques employed for testing web applications have either used traditional program coverage-based requirements or usage-based requirements. In thi...
Sreedevi Sampath, Sara Sprenkle, Emily Gibson, Lor...
DATE
2006
IEEE
94views Hardware» more  DATE 2006»
15 years 10 months ago
Reuse-based test access and integrated test scheduling for network-on-chip
In this paper, we propose a new method for test access and test scheduling in NoC-based system. It relies on a progressive reuse of the network resources for transporting test dat...
Chunsheng Liu, Zach Link, Dhiraj K. Pradhan