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TAICPART
2006
IEEE
15 years 10 months ago
Improving Testing Efficiency using Cumulative Test Analysis
Ian Holden, Dave Dalton
ASPDAC
2006
ACM
83views Hardware» more  ASPDAC 2006»
15 years 10 months ago
FCSCAN: an efficient multiscan-based test compression technique for test cost reduction
Youhua Shi, Nozomu Togawa, Shinji Kimura, Masao Ya...
DATE
2003
IEEE
76views Hardware» more  DATE 2003»
15 years 10 months ago
A Unified Approach for SOC Testing Using Test Data Compression and TAM Optimization
Vikram Iyengar, Anshuman Chandra, Sharon Schweizer...
ISCAS
2003
IEEE
89views Hardware» more  ISCAS 2003»
15 years 10 months ago
Systematic test program generation for SoC testing using embedded processor
Mohammad H. Tehranipour, Mehrdad Nourani, Seid Meh...