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» Advanced Measures for Empirical Testing
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NOCS
2007
IEEE
15 years 8 months ago
Towards Open Network-on-Chip Benchmarks
Measuring and comparing performance, cost, and other features of advanced communication architectures for complex multi core/multiprocessor systems on chip is a significant challe...
Cristian Grecu, André Ivanov, Partha Pratim...
CVPR
2006
IEEE
15 years 3 months ago
Locally Linear Models on Face Appearance Manifolds with Application to Dual-Subspace Based Classification
Recently, there has been a flurry of research on face recognition based on multiple images or shots from either a video sequence or an image set. This paper is also such an attemp...
Wei Fan, Dit-Yan Yeung
COMCOM
2011
14 years 9 months ago
Reconstructing social interactions using an unreliable wireless sensor network
In the very active field of complex networks, research advances have largely been stimulated by the availability of empirical data and the increase in computational power needed ...
Adrien Friggeri, Guillaume Chelius, Eric Fleury, A...
ICCAD
2010
IEEE
121views Hardware» more  ICCAD 2010»
14 years 12 months ago
Multi-Wafer Virtual Probe: Minimum-cost variation characterization by exploring wafer-to-wafer correlation
In this paper, we propose a new technique, referred to as MultiWafer Virtual Probe (MVP) to efficiently model wafer-level spatial variations for nanoscale integrated circuits. Tow...
Wangyang Zhang, Xin Li, Emrah Acar, Frank Liu, Rob...
CIDM
2009
IEEE
15 years 8 months ago
Ensemble member selection using multi-objective optimization
— Both theory and a wealth of empirical studies have established that ensembles are more accurate than single predictive models. Unfortunately, the problem of how to maximize ens...
Tuve Löfström, Ulf Johansson, Henrik Bos...