1728 search results - page 92 / 346 » Advanced empirical testing |
108
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COCOA
2010
Springer
14 years 10 months ago
2010
Springer
The classical and well-studied group testing problem is to find d defectives in a set of n elements by group tests, which tell us for any chosen subset whether it contains defectiv...
ICCD
1997
IEEE
15 years 4 months ago
1997
IEEE
: This paper studies pseudo-random pattern testing of bridging faults. Although bridging faults are generally more random pattern testable than stuck-at faults, examples are shown ...
HICSS
2009
IEEE
15 years 6 months ago
2009
IEEE
The requirement for power system operators to respond more efficiently to the stressed power system conditions that may create large number of alarms asks fort advanced alarm proc...
105
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EON
2008
15 years 1 months ago
2008
One of the arguments for choosing description logics as the basis for the Web Ontology Language is the ability to support the development of complex ontologies through logical reas...
113
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ISQED
2006
IEEE
15 years 6 months ago
2006
IEEE
— With advanced VLSI manufacturing technology in deep submicron (DSM) regime, we can integrate entire electronic systems on a single chip (SoC). Due to the complexity in SoC desi...