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122
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DATE
2009
IEEE
15 years 9 months ago
2009
IEEE
— During volume testing, test application time, test data volume and high performance automatic test equipment (ATE) are the major cost factors. Embedded testing including builti...
121
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DAC
2008
ACM
16 years 4 months ago
2008
ACM
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
188
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SIGMOD
2008
ACM
16 years 3 months ago
2008
ACM
Tools for generating test queries for databases do not explicitly take into account the actual data in the database. As a consequence, such tools cannot guarantee suitable coverag...
128
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VLSID
1993
IEEE
15 years 7 months ago
1993
IEEE
This paper discusses a Genetic Algorithm-based method of generating test vectorsfor detecting faults in combinational circuits. The GA-based approach combines the merits of two te...
121
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GECCO
2003
Springer
15 years 8 months ago
2003
Springer
Evolutionary Testing (ET) has been shown to be very successful in testing real world applications [16]. However, it has been pointed out [11], that further research is necessary if...