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TCAD
1998
96views more  TCAD 1998»
15 years 2 months ago
Diagnosis of clustered faults and wafer testing
—A probabilistic diagnosis algorithm is presented for constant degree structures. The performance of the algorithm is analyzed under a negative binomial failure distribution to a...
Kaiyuan Huang, Vinod K. Agarwal, Krishnaiyan Thula...
ACSAC
2010
IEEE
15 years 1 months ago
A framework for testing hardware-software security architectures
New security architectures are difficult to prototype and test at the design stage. Fine-grained monitoring of the interactions between hardware, the operating system, and applica...
Jeffrey S. Dwoskin, Mahadevan Gomathisankaran, Yu-...
KBSE
2008
IEEE
15 years 9 months ago
Test-Suite Augmentation for Evolving Software
One activity performed by developers during regression testing is test-suite augmentation, which consists of assessing the adequacy of a test suite after a program is modified an...
Raúl A. Santelices, Pavan Kumar Chittimalli...
COMPSAC
2004
IEEE
15 years 6 months ago
Web Application Bypass Testing
Input validation refers to checking user inputs to a program to ensure that they conform to expectations of the program. Input validation is used to check the format of numbers and...
Jeff Offutt, Ye Wu, Xiaochen Du, Hong Huang
SAC
2008
ACM
15 years 2 months ago
UML-based design test generation
In this paper we investigate and propose a fully automated technique to perform conformance checking of Java implementations against UML class diagrams. In our approach, we reused...
Waldemar Pires, João Brunet, Franklin Ramal...