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COMPSAC
2010
IEEE
15 years 1 months ago
Minimising the Preparation Cost of Runtime Testing Based on Testability Metrics
Abstract--Test cost minimisation approaches have traditionally been devoted to minimising "execution costs", while maximising coverage or reliability. However, in a runti...
Alberto González-Sanchez, Éric Piel,...
PTS
2010
167views Hardware» more  PTS 2010»
15 years 28 days ago
Vidock: A Tool for Impact Analysis of Aspect Weaving on Test Cases
The addition of a cross-cutting concern in a program, through aspect weaving, has an impact on its existing behaviors. If test cases exist for the program, it is necessary to ident...
Romain Delamare, Freddy Munoz, Benoit Baudry, Yves...
ITC
1995
IEEE
116views Hardware» more  ITC 1995»
15 years 6 months ago
An Experimental Chip to Evaluate Test Techniques: Chip and Experiment Design
An experiment has been designed to evaluate multiple testing techniques for combinational circuits. To perform the experiment, a 25k gate CMOS Test Chip has been designed, manufac...
Piero Franco, William D. Farwell, Robert L. Stokes...
ICSE
2009
IEEE-ACM
15 years 9 months ago
WISE: Automated test generation for worst-case complexity
Program analysis and automated test generation have primarily been used to find correctness bugs. We present complexity testing, a novel automated test generation technique to ...
Jacob Burnim, Sudeep Juvekar, Koushik Sen
ICSM
2005
IEEE
15 years 8 months ago
A Controlled Experiment Assessing Test Case Prioritization Techniques via Mutation Faults
Regression testing is an important part of software maintenance, but it can also be very expensive. To reduce this expense, software testers may prioritize their test cases so tha...
Hyunsook Do, Gregg Rothermel