This paper deals with Hybrid multisite testing of VLSI chips by utilizing automatic test equipment (ATE) in connection with built-in self-test (BIST). The performance of a multisi...
Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lomb...
We present an application of learning-based testing to the problem of automated test case generation (ATCG) for numerical software. Our approach uses n-dimensional polynomial model...
Test factoring creates fast, focused unit tests from slow systemwide tests; each new unit test exercises only a subset of the functionality exercised by the system tests. Augmenti...
We propose two statistical tests to determine if two samples are from different distributions. Our test statistic is in both cases the distance between the means of the two sample...
Arthur Gretton, Karsten M. Borgwardt, Malte J. Ras...
As diagnostic testing for memory devices increasingly gains in importance, companies are looking for flexible, cost effective methods to perform diagnostics on their failing devi...