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ITC
2003
IEEE
93views Hardware» more  ITC 2003»
15 years 3 months ago
Hybrid Multisite Testing at Manufacturing
This paper deals with Hybrid multisite testing of VLSI chips by utilizing automatic test equipment (ATE) in connection with built-in self-test (BIST). The performance of a multisi...
Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lomb...
94
Voted
PTS
2010
134views Hardware» more  PTS 2010»
14 years 8 months ago
A Learning-Based Approach to Unit Testing of Numerical Software
We present an application of learning-based testing to the problem of automated test case generation (ATCG) for numerical software. Our approach uses n-dimensional polynomial model...
Karl Meinke, Fei Niu
PASTE
2004
ACM
15 years 3 months ago
Mock object creation for test factoring
Test factoring creates fast, focused unit tests from slow systemwide tests; each new unit test exercises only a subset of the functionality exercised by the system tests. Augmenti...
David Saff, Michael D. Ernst
96
Voted
CORR
2008
Springer
130views Education» more  CORR 2008»
14 years 10 months ago
A Kernel Method for the Two-Sample Problem
We propose two statistical tests to determine if two samples are from different distributions. Our test statistic is in both cases the distance between the means of the two sample...
Arthur Gretton, Karsten M. Borgwardt, Malte J. Ras...
62
Voted
ATS
2009
IEEE
119views Hardware» more  ATS 2009»
15 years 5 months ago
Fault Diagnosis Using Test Primitives in Random Access Memories
As diagnostic testing for memory devices increasingly gains in importance, companies are looking for flexible, cost effective methods to perform diagnostics on their failing devi...
Zaid Al-Ars, Said Hamdioui