7253 search results - page 67 / 1451 » Agile Performance Testing |
80
Voted
WADS
2005
Springer
15 years 3 months ago
2005
Springer
We study practically efficient methods for performing combinatorial group testing. We present efficient non-adaptive and two-stage combinatorial group testing algorithms, which i...
ICCD
2003
IEEE
15 years 3 months ago
2003
IEEE
We present a test scheduling methodology for core-based system-on-chips that allows tradeoff between system power dissipation and overall test time. The basic strategy is to use t...
DATE
2010
IEEE
15 years 3 months ago
2010
IEEE
—Many systems are based on embedded microcontrollers. Applications demand for production and Power-On testing, including memory testing. Because low-end microcontrollers may not ...
96
Voted
ISCAS
2011
IEEE
14 years 1 months ago
2011
IEEE
—Linearity and spectral performance test contributes most cost of ADC test. This paper presents a new method for testing an ADC’s SNR from its linearity test data. The method d...
ATS
2009
IEEE
15 years 5 months ago
2009
IEEE
High performance designs often use the on-chip device PLLs for accurate test clock generation during testing. The on-chip clock generator is designed in a programmable way to faci...