7253 search results - page 964 / 1451 » Agile Performance Testing |
178
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DAC
2008
ACM
16 years 7 months ago
2008
ACM
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
138
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DAC
2002
ACM
16 years 7 months ago
2002
ACM
Many real-time embedded systems involve a collection of independently executing event-driven code blocks, having hard real-time constraints. Tasks in many such systems, like netwo...
164
Voted
DAC
2003
ACM
16 years 7 months ago
2003
ACM
This paper presents a power grid analyzer based on a random walk technique. A linear-time algorithm is first demonstrated for DC analysis, and is then extended to perform transien...
153
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DAC
2003
ACM
16 years 7 months ago
2003
ACM
The classic algorithm for optimal buffer insertion due to van Ginneken has time and space complexity O(n2 ), where n is the number of possible buffer positions. We present a new a...
146
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DAC
2005
ACM
16 years 7 months ago
2005
ACM
Recent study shows that the existing first order canonical timing model is not sufficient to represent the dependency of the gate delay on the variation sources when processing an...