8825 search results - page 319 / 1765 » All for one or one for all |
DATE
2007
IEEE
15 years 8 months ago
2007
IEEE
Formal verification is an important issue in circuit and system design. In this context, Bounded Model Checking (BMC) is one of the most successful techniques. But even if all sp...
DSD
2007
IEEE
15 years 8 months ago
2007
IEEE
This paper presents an optimized fault diagnosing procedure applicable in Built-in Self-Test environments. Instead of the known approach based on a simple bisection of patterns in...
102
Voted
DSN
2007
IEEE
15 years 8 months ago
2007
IEEE
— Device scaling and large integration increase the vulnerability of microprocessors to transient errors. One of the structures where errors can be most harmful is the register ...
109
Voted
FUZZIEEE
2007
IEEE
15 years 8 months ago
2007
IEEE
Abstract— In the resolution of group decision making problems the consensus process, that is, the process where experts discuss about the alternatives to narrow their differences...
ICC
2007
IEEE
15 years 8 months ago
2007
IEEE
— In this work, coding for the relay channel (RC) and the cooperative relay broadcast channel (RBC) controlled by random parameters are studied. In the first channel, the RC, in...