2632 search results - page 471 / 527 » Alternating Timed Automata |
100
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ICCD
2008
IEEE
15 years 8 months ago
2008
IEEE
Abstract— Over the last decade, the design of ultra-lowpower digital circuits in subthreshold regime has been driven by the quest for minimum energy per operation. In this contri...
ICCD
2005
IEEE
15 years 8 months ago
2005
IEEE
Recent studies have shown that in highly associative caches, the performance gap between the Least Recently Used (LRU) and the theoretical optimal replacement algorithms is large,...
ICCAD
2007
IEEE
15 years 8 months ago
2007
IEEE
Abstract— This paper addresses the module assignment problem in pinlimited designs under the stacked-Vdd circuit paradigm. A partition-based algorithm is presented for efficient...
112
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ICCAD
2003
IEEE
15 years 8 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
124
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ICCAD
2001
IEEE
15 years 8 months ago
2001
IEEE
The increasing popularity of SAT and BDD techniques in verification and synthesis encourages the search for additional speed-ups. Since typical SAT and BDD algorithms are exponent...