2451 search results - page 169 / 491 » Alternative Test Methods Using IEEE 1149.4 |
132
click to vote
ITC
2000
IEEE
15 years 7 months ago
2000
IEEE
Transient Signal Analysis (TSA) is a Go/No-Go device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, a technique based o...
129
Voted
HOST
2008
IEEE
15 years 9 months ago
2008
IEEE
This paper addresses a new threat to the security of integrated circuits (ICs) used in safety critical, security and military systems. The migration of IC fabrication to low-cost ...
148
click to vote
SMI
2006
IEEE
15 years 9 months ago
2006
IEEE
Databases of 3D shapes have become widespread for a variety of applications, and a key research problem is searching these databases for similar shapes. This paper introduces a me...
ICDIM
2008
IEEE
15 years 9 months ago
2008
IEEE
This paper presents a novel payload analysis method. Consecutive bytes are separated by boundary symbols and defined as words. The frequencies of word appearance and word to word ...
145
click to vote
VLSID
2006
IEEE
16 years 3 months ago
2006
IEEE
Logarithmic Number Systems (LNS) offer a viable alternative in terms of area, delay and power to binary number systems for multiplication and division operations in signal process...