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» Alternative Test Methods Using IEEE 1149.4
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EURODAC
1994
IEEE
145views VHDL» more  EURODAC 1994»
15 years 7 months ago
Testability analysis and improvement from VHDL behavioral specifications
This paper presents a testability improvement method for digital systems described in VHDL behavioral specification. The method is based on testability analysis at registertransfe...
Xinli Gu, Krzysztof Kuchcinski, Zebo Peng
96
Voted
ITC
1998
IEEE
59views Hardware» more  ITC 1998»
15 years 7 months ago
Stimulus generation for built-in self-test of charge-pump phase-locked loops
Abstract - This paper addresses the issue of the stimulation of charge-pump phase-locked loops for built-in selftest applications. It is shown that three nodes of the PLL qualify f...
Benoît R. Veillette, Gordon W. Roberts
140
Voted
BMCBI
2010
160views more  BMCBI 2010»
15 years 3 months ago
Annotation of gene promoters by integrative data-mining of ChIP-seq Pol-II enrichment data
Background: Use of alternative gene promoters that drive widespread cell-type, tissue-type or developmental gene regulation in mammalian genomes is a common phenomenon. Chromatin ...
Ravi Gupta, Priyankara Wikramasinghe, Anirban Bhat...
118
Voted
CVPR
2009
IEEE
16 years 10 months ago
Planar Orientation from Blur Gradients in a Single Image
We present a focus-based method to recover the orientation of a textured planar surface patch from a single image. The method exploits the relationship between the orientation o...
Michael S. Langer, Scott McCloskey
120
Voted
ICIP
2005
IEEE
16 years 5 months ago
Wavelet-based illumination normalization for face recognition
The appearance of a face image is severely affected by illumination conditions that hinder the automatic face recognition process. To recognize faces under varying illuminations, ...
Shan Du, Rabab Kreidieh Ward