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» Alternative Test Methods Using IEEE 1149.4
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DATE
1998
IEEE
74views Hardware» more  DATE 1998»
15 years 8 months ago
State Relaxation Based Subsequence Removal for Fast Static Compaction in Sequential Circuits
We extend the subsequence removal technique to provide signi cantly higher static compaction for sequential circuits. We show that state relaxation techniques can be used to ident...
Michael S. Hsiao, Srimat T. Chakradhar
AGILEDC
2007
IEEE
15 years 10 months ago
Scrum and CMMI Level 5: The Magic Potion for Code Warriors
Projects combining agile methods with CMMI1 are more successful in producing higher quality software that more effectively meets customer needs at a faster pace. Systematic Softwa...
Jeff Sutherland, Carsten Ruseng Jakobsen, Kent Joh...
ICDAR
2003
IEEE
15 years 9 months ago
A Line Drawings Degradation Model for Performance Characterization
Line detection algorithms constitute the basis for technical document analysis and recognition. The performance of these algorithms decreases as the quality of the documents degra...
Jian Zhai, Liu Wenyin, Dov Dori, Qing Li
VTS
2003
IEEE
119views Hardware» more  VTS 2003»
15 years 9 months ago
A Circuit Level Fault Model for Resistive Opens and Bridges
Delay faults are an increasingly important test challenge. Traditional open and bridge fault models are incomplete because only the functional fault or a subset of delay fault are...
Zhuo Li, Xiang Lu, Wangqi Qiu, Weiping Shi, D. M. ...
AGILEDC
2009
IEEE
15 years 9 months ago
Scrum and CMMI
Projects combining agile methods with CMMI1 are more successful in producing higher quality software that more effectively meets customer needs at a faster pace. Systematic Softwa...
Carsten Ruseng Jakobsen, Jeff Sutherland