2451 search results - page 332 / 491 » Alternative Test Methods Using IEEE 1149.4 |
102
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DATE
2007
IEEE
15 years 11 months ago
2007
IEEE
An important aspect of Design for Yield for embedded SRAM is identifying the expected worst case behavior in order to guarantee that sufficient design margin is present. Previousl...
145
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ICCAD
2003
IEEE
15 years 10 months ago
2003
IEEE
Process variations have become a critical issue in performance verification of high-performance designs. We present a new, statistical timing analysis method that accounts for int...
128
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INFOCOM
2003
IEEE
15 years 10 months ago
2003
IEEE
— Considerable attention has been focused on the properties of graphs derived from Internet measurements. Router-level topologies collected via traceroute-like methods have led s...
137
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FGR
2002
IEEE
15 years 9 months ago
2002
IEEE
In this paper, we present a scheme for face authentication in the presence of variations. To deal with variations, such as facial expressions and registration errors, with which t...
146
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ICCV
2011
IEEE
14 years 4 months ago
2011
IEEE
In the real visual world, the number of categories a classifier needs to discriminate is on the order of hundreds or thousands. For example, the SUN dataset [24] contains 899 sce...