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» Alternative Test Methods Using IEEE 1149.4
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ISQED
2010
IEEE
141views Hardware» more  ISQED 2010»
15 years 4 months ago
Assessing chip-level impact of double patterning lithography
—Double patterning lithography (DPL) provides an attractive alternative or a supplementary method to enable the 32nm and 22nm process nodes, relative to costlier technology optio...
Kwangok Jeong, Andrew B. Kahng, Rasit Onur Topalog...
FDL
2003
IEEE
15 years 3 months ago
Object-Oriented ASIP Design and Synthesis
SystemC-Plus from the ODETTE project provides the ability to simulate and synthesise object-oriented specifications into hardware. The current ODETTE compiler translates each obj...
Maziar Goudarzi, Shaahin Hessabi, Alan Mycroft
ICDM
2010
IEEE
273views Data Mining» more  ICDM 2010»
14 years 8 months ago
Learning Maximum Lag for Grouped Graphical Granger Models
Temporal causal modeling has been a highly active research area in the last few decades. Temporal or time series data arises in a wide array of application domains ranging from med...
Amit Dhurandhar
ICASSP
2011
IEEE
14 years 1 months ago
Real-time conjugate gradients for online fMRI classification
Real-time functional magnetic resonance imaging (rtfMRI) enables classification of brain activity during data collection thus making inference results accessible to both the subj...
Hao Xu, Yongxin Taylor Xi, Ray Lee, Peter J. Ramad...
CEC
2009
IEEE
15 years 2 months ago
Memetic algorithm with Local search chaining for large scale continuous optimization problems
Abstract— Memetic algorithms arise as very effective algorithms to obtain reliable and high accurate solutions for complex continuous optimization problems. Nowadays, high dimens...
Daniel Molina, Manuel Lozano, Francisco Herrera