2451 search results - page 432 / 491 » Alternative Test Methods Using IEEE 1149.4 |
ISCA
2008
IEEE
15 years 4 months ago
2008
IEEE
As CMOS technology scales and more transistors are packed on to the same chip, soft error reliability has become an increasingly important design issue for processors. Prior resea...
RTAS
2006
IEEE
15 years 4 months ago
2006
IEEE
A notable features of many proposed Wireless Sensor Networks (WSNs) deployments is their scale: hundreds to thousands of nodes linked together. In such systems, modeling the state...
ICRA
2010
IEEE
14 years 8 months ago
2010
IEEE
Autonomous landing on unknown extraterrestrial bodies requires fast, noise-resistant motion processing to elicit appropriate steering commands. Flying insects excellently master vi...
VLSID
2005
IEEE
15 years 10 months ago
2005
IEEE
Modern digital circuits consist of logic gates implemented in the complementary metal oxide semiconductor (CMOS) technology. The time taken for a logic gate output to change after...
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PRDC
2009
IEEE
15 years 4 months ago
2009
IEEE
—With ever-growing complexity of computer and communication systems analytical methods do not scale, especially with respect to dependability assessment of information technology...