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» Alternative Test Methods Using IEEE 1149.4
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IPPS
1998
IEEE
15 years 2 months ago
Predicting the Running Times of Parallel Programs by Simulation
Predicting the running time of a parallel program is useful for determining the optimal values for the parameters of the implementation and the optimal mapping of data on processo...
Radu Rugina, Klaus E. Schauser
HASE
1997
IEEE
15 years 2 months ago
ReSoFT: A Reusable Testbed for Development and Evaluation of Software Fault-Tolerant Systems
The Reusable Software Fault Tolerance Testbed ReSoFT was developed to facilitate the development and evaluation of high-assurance systems that require tolerance of both hardware...
Kam S. Tso, Eltefaat Shokri, Roger J. Dziegiel Jr.
CCECE
2006
IEEE
15 years 1 months ago
Variable Step-Size Affine Projection Algorithm with a Weighted and Regularized Projection Matrix
This paper presents a forgetting factor scheme for variable step-size affine projection algorithms (APA). The proposed scheme uses a forgetting processed input matrix as the projec...
Tao Dai, Andy Adler, Behnam Shahrrava
ARVLSI
1995
IEEE
78views VLSI» more  ARVLSI 1995»
15 years 1 months ago
A technique for high-speed, fine-resolution pattern generation and its CMOS implementation
This paper presents an architecture for generating a high-speed data pattern with precise edge placement resolution by using the matched delay technique. The technique involves ...
Gary C. Moyer, Mark Clements, Wentai Liu, Toby Sch...
ACHI
2008
IEEE
14 years 12 months ago
Specification for User Modeling with Self-Observing Systems
The complicated user interfaces and complex functionality of nowadays interactive products lead to a new class of failures: People do not understand their products and thus fail t...
Mathias Funk, Piet van der Putten, Henk Corporaal