A critical step in defect detection for semiconductorprocess is to align a test image against a reference. This includes both spatial alignment and grayscale alignment. For the la...
— Area Under the ROC Curve (AUC) is often used to evaluate ranking performance in binary classification problems. Several researchers have approached AUC optimization by approxi...
We propose a new algorithm for dimensionality reduction and unsupervised text classification. We use mixture models as underlying process of generating corpus and utilize a novel,...
This poster is a case study on the application of a novel programming model, called Concurrent Collections (CnC), to the implementation of an asynchronous-parallel algorithm for c...
We present an algorithm for solving Diophantine equations which are linear in the variables, but non-linear in one parameter. This enables us to compute data dependences in more ge...