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» An Analysis Tool for Coupling-Based Integration Testing
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GLVLSI
2005
IEEE
122views VLSI» more  GLVLSI 2005»
15 years 3 months ago
Thermal aware cell-based full-chip electromigration reliability analysis
A hierarchical scheme with cells and modules is crucial for managing design complexity during a large integrated circuit design. We present a methodology for thermal aware cell-ba...
Syed M. Alam, Donald E. Troxel, Carl V. Thompson
ICSE
2007
IEEE-ACM
15 years 9 months ago
Revel8or: Model Driven Capacity Planning Tool Suite
Designing complex multi-tier applications that must meet strict performance requirements is a challenging software engineering problem. Ideally, the application architect could de...
Liming Zhu, Yan Liu, Ngoc Bao Bui, Ian Gorton
DSN
2007
IEEE
15 years 3 months ago
Web Services Wind Tunnel: On Performance Testing Large-Scale Stateful Web Services
New versions of existing large-scale web services such as Passport.com© have to go through rigorous performance evaluations in order to ensure a high degree of availability. Perf...
Marcelo De Barros, Jing Shiau, Chen Shang, Kenton ...
SIGSOFT
2006
ACM
15 years 3 months ago
Detecting increases in feature coupling using regression tests
Repeated changes to a software system can introduce small weaknesses such as unplanned dependencies between different parts of the system. While such problems usually go undetecte...
Olivier Giroux, Martin P. Robillard
DAC
2007
ACM
15 years 10 months ago
Transition Delay Fault Test Pattern Generation Considering Supply Voltage Noise in a SOC Design
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram