921 search results - page 50 / 185 » An Anthropometric Face Model Using Variational Techniques |
ASPDAC
2006
ACM
15 years 3 months ago
2006
ACM
— Process variations and temperature variations can cause both the frequency and the leakage of the chip to vary significantly from their expected values, thereby decreasing the...
PRL
2010
14 years 8 months ago
2010
: Single training image face recognition is one of main challenges to appearance-based pattern recognition techniques. Many classical dimensionality reduction methods such as LDA h...
DAC
2006
ACM
15 years 10 months ago
2006
ACM
As VLSI technology scales toward 65nm and beyond, both timing and power performance of integrated circuits are increasingly affected by process variations. In practice, people oft...
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DT
2006
14 years 9 months ago
2006
The widely used engineering decisions concerning the performance of technological equipment for process industries are usually deterministic. Since the early 1990s probabilistic m...
ICIP
2002
IEEE
15 years 11 months ago
2002
IEEE
In this paper we evaluate the effectiveness of two likelihood normalization techniques, the Background Model Set (BMS) and the Universal Background Model (UBM), for improving perf...