PSP and the backward propagation of variance (BPV) method are used to characterize the statistical variations of metal-oxide-semiconductor field effect transistors (MOSFETs). BPV s...
Xin Li, Colin C. McAndrew, Weimin Wu, Samir Chaudh...
We present techniques for estimating switching activity and power consumption in register-transfer level (RTL) circuits. Previous work on this topic has ignored the presence of gl...
We present a novel mixed-state dynamic Bayesian network (DBN) framework for modeling and classifying timeseries data such as object trajectories. A hidden Markov model (HMM) of di...
Vladimir Pavlovic, Brendan J. Frey, Thomas S. Huan...
We present a method to acquire the reflectance field of a human face and use these measurements to render the face under arbitrary changes in lighting and viewpoint. We first acqu...
Paul E. Debevec, Tim Hawkins, Chris Tchou, Haarm-P...
Maximum entropy models are a common modeling technique, but prone to overfitting. We show that using an exponential distribution as a prior leads to bounded absolute discounting b...