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VLSID
2000
IEEE
102views VLSI» more  VLSID 2000»
15 years 2 months ago
Inductance Characterization of Small Interconnects Using Test-Signal Method
The test signal method can be used to measure and model inductance parameters (self and mutual) of a very small interconnect especially in highdensity IC’s by using a test signa...
Jeegar Tilak Shah, Madhav P. Desai, Sugata Sanyal
CCS
2010
ACM
14 years 10 months ago
AccessMiner: using system-centric models for malware protection
Models based on system calls are a popular and common approach to characterize the run-time behavior of programs. For example, system calls are used by intrusion detection systems...
Andrea Lanzi, Davide Balzarotti, Christopher Krueg...
ACMACE
2009
ACM
14 years 7 months ago
Facial caricature generation using a quadratic deformation model
In this paper we propose a novel approach for generating expressive caricatures from an input image. The novelty of this work comes from combining an Active Appearance Model facia...
Mohammad Obaid, D. Lond, Ramakrishnan Mukundan, Ma...
ICIP
2005
IEEE
15 years 11 months ago
Detection of semantic objects using description graphs
This paper presents a technique to detect instances of classes (objects) according to their semantic definition in the form of a Description Graph. Classes are defined as combinat...
Ferran Marqués, Xavier Giro
DATE
2008
IEEE
204views Hardware» more  DATE 2008»
15 years 4 months ago
Deep Submicron Interconnect Timing Model with Quadratic Random Variable Analysis
Shrinking feature sizes and process variations are of increasing concern in modern technology. It is urgent that we develop statistical interconnect timing models which are harmon...
Jun-Kuei Zeng, Chung-Ping Chen