495 search results - page 41 / 99 » An Approach to Integration Testing Based on Data Flow Specif... |
133
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DAC
2009
ACM
16 years 5 months ago
2009
ACM
Post-silicon validation has become an essential step in the design flow of today's complex integrated circuits. One effective technique that provides real-time visibility to ...
156
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WWW
2005
ACM
16 years 4 months ago
2005
ACM
The demand for quickly delivering new applications is increasingly becoming a business imperative today. Application development is often done in an ad hoc manner, without standar...
114
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DAC
2004
ACM
16 years 5 months ago
2004
ACM
The negative effect of electromigration on signal and power line lifetime and functional reliability is an increasingly important problem for the physical design of integrated cir...
146
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TVLSI
2008
15 years 4 months ago
2008
Abstract--Technology scaling in the nanometer era has increased the transistor's susceptibility to process variations. The effects of such variations are having a huge impact ...
151
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SIGMOD
2001
ACM
16 years 4 months ago
2001
ACM
Digital archives are dedicated to the long-term preservation of electronic information and have the mandate to enable sustained access despite rapid technology changes. Persistent...