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ECAI
2000
Springer
15 years 7 months ago
Similarity-based Approach to Relevance Learning
In several information retrieval (IR) systems there is a possibility for user feedback. Many machine learning methods have been proposed that learn from the feedback information in...
Rickard Cöster, Lars Asker
IWANN
2007
Springer
15 years 9 months ago
Non-parametric Residual Variance Estimation in Supervised Learning
The residual variance estimation problem is well-known in statistics and machine learning with many applications for example in the field of nonlinear modelling. In this paper, we...
Elia Liitiäinen, Amaury Lendasse, Francesco C...
ICDAR
2009
IEEE
15 years 1 months ago
Learning on the Fly: Font-Free Approaches to Difficult OCR Problems
Despite ubiquitous claims that optical character recognition (OCR) is a "solved problem," many categories of documents continue to break modern OCR software such as docu...
Andrew Kae, Erik G. Learned-Miller
KDD
2000
ACM
211views Data Mining» more  KDD 2000»
15 years 6 months ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka
ATAL
2005
Springer
15 years 8 months ago
An agent-based approach for managing symbiotic simulation of semiconductor assembly and test operation
The rapid changing business environment of high-tech asset intensive enterprises such as semiconductor manufacturing constantly drives production managers to look for better solut...
Malcolm Yoke-Hean Low, Kong Wei Lye, Peter Lenderm...