1100 search results - page 77 / 220 » An Approach to Test Aspect-oriented Programs |
127
Voted
ISCAS
1999
IEEE
15 years 7 months ago
1999
IEEE
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
175
Voted
SOCO
2010
Springer
15 years 1 months ago
2010
Springer
This paper presents an evolutionary algorithm for modeling the arrival dates in time-stamped data sequences such as newscasts, e-mails, IRC conversations, scientific journal artic...
125
Voted
ICSE
2008
IEEE-ACM
16 years 4 months ago
2008
IEEE-ACM
Fault-localization techniques that utilize information about all test cases in a test suite have been presented. These techniques use various approaches to identify the likely fau...
106
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SIGCSE
2003
ACM
15 years 8 months ago
2003
ACM
Students in programming courses generally write “toy” programs, even when the size of the assigned projects is large. Programming assignments are written, superficially teste...
113
Voted
DELFI
2003
15 years 4 months ago
2003
Abstract: In a virtual university, advanced support for all aspects of handling assignments is needed. Homework assignments are particularly in need of help because communication b...