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DAC
2007
ACM
16 years 5 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
LICS
2010
IEEE
15 years 2 months ago
Abstracting the Differential Semantics of Rule-Based Models: Exact and Automated Model Reduction
ing the differential semantics of rule-based models: exact and automated model reduction (Invited Lecture) Vincent Danos∗§, J´erˆome Feret†, Walter Fontana‡, Russell Harme...
Vincent Danos, Jérôme Feret, Walter F...
CORR
2011
Springer
135views Education» more  CORR 2011»
14 years 11 months ago
Planning with Partial Preference Models
In many real-world planning scenarios, the users are interested in optimizing multiple objectives (such as makespan and execution cost), but are unable to express their exact trad...
Tuan A. Nguyen, Minh Binh Do, Alfonso Gerevini, Iv...
FGCS
2011
123views more  FGCS 2011»
14 years 11 months ago
Mapping attribution metadata to the Open Provenance Model
A description of a data item’s provenance can be provided in different forms, and which form is best depends on the intended use of that description. Because of this, differen...
Simon Miles
UAI
2008
15 years 5 months ago
CT-NOR: Representing and Reasoning About Events in Continuous Time
We present a generative model for representing and reasoning about the relationships among events in continuous time. We apply the model to the domain of networked and distributed...
Aleksandr Simma, Moisés Goldszmidt, John Ma...