60 search results - page 11 / 12 » An Efficient Path Delay Fault Coverage Estimator |
62
Voted
ICCAD
2005
IEEE
15 years 6 months ago
2005
IEEE
— Increasingly prominent variational effects impose imminent threat to the progress of VLSI technology. This work explores redundancy, which is a well-known fault tolerance techn...
DATE
2004
IEEE
15 years 1 months ago
2004
IEEE
Due to process variations in deep sub-micron (DSM) technologies, the effects of timing defects are difficult to capture. This paper presents a novel coverage metric for estimating...
TON
2008
14 years 9 months ago
2008
Estimating distances in the Internet has been studied in the recent years due to its ability to improve the performance of many applications, e.g., in the peer-topeer realm. One sc...
ISLPED
2007
ACM
14 years 11 months ago
2007
ACM
Negative bias temperature instability (NBTI) has become a dominant reliability concern for nanoscale PMOS transistors. In this paper, we propose variable-latency adder (VL-adder) ...
ISCAS
2007
IEEE
15 years 3 months ago
2007
IEEE
— With increasing reliability concerns for current and next generation VLSI technologies, fault-tolerance is fast becoming an integral part of system-on-chip (SoC) and multicore ...