4 search results - page 1 / 1 » An Efficient Scheme to Diagnose Scan Chains |
ITC
1997
IEEE
15 years 1 months ago
1997
IEEE
65
Voted
ITC
2003
IEEE
15 years 2 months ago
2003
IEEE
Intermittent scan chain hold-time fault is discussed in this paper and a method to diagnose the faulty site in a scan chain is proposed as well. Unlike the previous scan chain dia...
ET
2000
14 years 9 months ago
2000
An efficient deterministic BIST scheme based on partial scan chains together with a scan selection algorithm tailored for BIST is presented. The algorithm determines a minimum num...
INFOCOM
2010
IEEE
14 years 7 months ago
2010
IEEE
RFID is an emerging technology with many potential applications such as inventory management for supply chain. In practice, these applications often need a series of continuous sca...