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» An Embedded IDDQ Testing Architecture and Technique
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DATE
2003
IEEE
130views Hardware» more  DATE 2003»
13 years 11 months ago
A Technique for High Ratio LZW Compression
Reduction of both the test suite size and the download time of test vectors is important in today's System-On-a-Chip designs. In this paper, a method for compressing the scan...
Michael J. Knieser, Francis G. Wolff, Christos A. ...
DAC
1997
ACM
13 years 10 months ago
Hardware/Software Co-Simulation in a VHDL-Based Test Bench Approach
Novel test bench techniques are required to cope with a functional test complexity which is predicted to grow much more strongly than design complexity. Our test bench approach at...
Matthias Bauer, Wolfgang Ecker
ETS
2006
IEEE
108views Hardware» more  ETS 2006»
14 years 14 days ago
A DFT Architecture for Asynchronous Networks-on-Chip
The Networks-on-Chip (NoCs) paradigm is emerging as a solution for the communication of SoCs. Many NoC architecture propositions are presented but few works on testing these netwo...
Xuan-Tu Tran, Jean Durupt, François Bertran...
DAC
2012
ACM
11 years 8 months ago
Towards fault-tolerant embedded systems with imperfect fault detection
Many state-of-the-art approaches on fault-tolerant system design make the simplifying assumption that all faults are detected within a certain time interval. However, based on a d...
Jia Huang, Kai Huang, Andreas Raabe, Christian Buc...
GECCO
2004
Springer
145views Optimization» more  GECCO 2004»
13 years 11 months ago
Search Based Automatic Test-Data Generation at an Architectural Level
Abstract. The need for effective testing techniques for architectural level descriptions is widely recognised. However, due to the variety of domain-specific architectural descript...
Yuan Zhan, John A. Clark