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» An Experimental Chip to Evaluate Test Techniques: Chip and E...
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ITC
1997
IEEE
73views Hardware» more  ITC 1997»
13 years 10 months ago
A Low-Overhead Design for Testability and Test Generation Technique for Core-Based Systems
In a fundamental paradigm shift in system design, entire systems are being built on a single chip, using multiple embedded cores. Though the newest system design methodology has s...
Indradeep Ghosh, Niraj K. Jha, Sujit Dey
VTS
1998
IEEE
98views Hardware» more  VTS 1998»
13 years 10 months ago
Experimental Results for IDDQ and VLV Testing
An experimental test chip was designed and manufactured to evaluate different test techniques. Based on the results presented in the wafer probe, 309 out of 5491 dies that passed ...
Jonathan T.-Y. Chang, Chao-Wen Tseng, Yi-Chin Chu,...
DFT
2003
IEEE
113views VLSI» more  DFT 2003»
13 years 11 months ago
Buffer and Controller Minimisation for Time-Constrained Testing of System-On-Chip
Test scheduling and Test Access Mechanism (TAM) design are two important tasks in the development of a System-on-Chip (SOC) test solution. Previous test scheduling techniques assu...
Anders Larsson, Erik Larsson, Petru Eles, Zebo Pen...
DSD
2005
IEEE
116views Hardware» more  DSD 2005»
13 years 12 months ago
Optimization of a Bus-based Test Data Transportation Mechanism in System-on-Chip
The increasing amount of test data needed to test SOC (System-on-Chip) entails efficient design of the TAM (test access mechanism), which is used to transport test data inside the...
Anders Larsson, Erik Larsson, Petru Eles, Zebo Pen...
ISESE
2003
IEEE
13 years 11 months ago
An Experimental Evaluation of Inspection and Testing for Detection of Design Faults
The two most common strategies for verification and validation, inspection and testing, are in a controlled experiment evaluated in terms of their fault detection capabilities. Th...
Carina Andersson, Thomas Thelin, Per Runeson, Nina...