644 search results - page 23 / 129 » An Experimental Chip to Evaluate Test Techniques: Experiment... |
CPHYSICS
2007
14 years 11 months ago
2007
In the context of the analysis of measured data, one is often faced with the task to differentiate data numerically. Typically, this occurs when measured data are concerned or dat...
DELTA
2008
IEEE
15 years 6 months ago
2008
IEEE
Scan is a widely used design-for-testability technique to improve test and diagnosis quality, however, scan chain failures account for almost 50% of chip failures. In this paper, ...
SP
2010
IEEE
15 years 3 months ago
2010
IEEE
The computer systems security arms race between attackers and defenders has largely taken place in the domain of software systems, but as hardware complexity and design processes ...
ICCD
2007
IEEE
15 years 3 months ago
2007
IEEE
This paper presents a novel power reduction method for chip multi-processors (CMPs) under real-time constraints. While the power consumption of processing units (PUs) on CMPs can ...
ISCAS
2005
IEEE
15 years 5 months ago
2005
IEEE
- This paper presents program pulse characterization in an 8-Mb BJT-selected Phase-Change Memory test chip. Experimental results of the impact of the bit-line resistance over progr...