644 search results - page 45 / 129 » An Experimental Chip to Evaluate Test Techniques: Experiment... |
119
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VLDB
2007
ACM
15 years 6 months ago
2007
ACM
Testing a database engine has been and continues to be a challenging task. The space of possible SQL queries along with their possible access paths is practically unbounded. Moreo...
MOBISYS
2007
ACM
15 years 11 months ago
2007
ACM
We envision a new better-together mobile application paradigm where multiple mobile devices are placed in a close proximity and study a specific together-viewing video application...
ET
2010
14 years 10 months ago
2010
Abstract As technology scales down into the nanometer era, delay testing of modern chips has become more and more important. Tests for the path delay fault model are widely used to...
ICCD
2008
IEEE
15 years 8 months ago
2008
IEEE
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...
109
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ASPDAC
2004
ACM
15 years 5 months ago
2004
ACM
— We examine an abstract formulation of BIST diagnosis in digital logic systems. The BIST diagnosis problem has applications that include identification of erroneous test vector...