644 search results - page 57 / 129 » An Experimental Chip to Evaluate Test Techniques: Experiment... |
121
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MICRO
2008
IEEE
15 years 6 months ago
2008
IEEE
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
100
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CCGRID
2001
IEEE
15 years 3 months ago
2001
IEEE
In this paper, we describe the results of an experiment to add support for multimethod communication to the NexusJava communications library using metalevel programming techniques...
117
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ITC
2003
IEEE
15 years 5 months ago
2003
IEEE
Embedded memories are among the most widely used cores in current system-on-chip (SOC) implementations. Memory cores usually occupy a significant portion of the chip area, and do...
188
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KCAP
2011
ACM
14 years 2 months ago
2011
ACM
Gold standard mappings created by experts are at the core of alignment evaluation. At the same time, the process of manual evaluation is rarely discussed. While the practice of ha...
LREC
2008
15 years 1 months ago
2008
The present contribution aims at increasing our understanding of automatic speech recognition (ASR) errors involving frequent homophone or almost homophone words by confronting th...